mechanical software suite release 11.0 (ANSYS inc)
90
Structured Review
ANSYS inc
mechanical software suite release 11.0
Mechanical Software Suite Release 11.0, supplied by ANSYS inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/mechanical+software+suite+release+11%2E0/mechanical+software+suite+release+11+0/10__1063_slash_1__4826524-337-0-5
Average 90 stars, based on 1 article reviews
Mechanical Software Suite Release 11.0, supplied by ANSYS inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/mechanical+software+suite+release+11%2E0/mechanical+software+suite+release+11+0/10__1063_slash_1__4826524-337-0-5
Average 90 stars, based on 1 article reviews
mechanical software suite release 11.0 - by Bioz Stars,
2026-10
90/100 stars
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other:Article Title: The impact of mechanical stress on the degradation of AlGaN/GaN high electron mobility transistors Article Snippet: The impact of mechanical stress on the degradation of AlGaN/GaN high electron mobility transistors Sukwon Choi, Eric Heller, Donald Dorsey, Ramakrishna Vetury, and Samuel Graham Citation: Journal of Applied Physics 114, 164501 (2013); doi: 10.1063/1.4826524 View online: http://dx.doi.org/10.1063/1.4826524 View Table of Contents: http://scitation.aip.org/content/aip/journal/jap/114/16?ver=pdfcov Published by the AIP Publishing Articles you may be interested in Analysis of the residual stress distribution in AlGaN/GaN high electron mobility transistors J. Appl.. Phys.. 113, 093510 (2013); 10.1063/1.4794009 Modeling of the reverse gate leakage in AlGaN/GaN high electron mobility transistors J. Appl. |